A stochastic encoder using point defects in two-dimensional materials

Journal article

• Category (PICK ONE FROM LIST; DO NOT CHANGE OR ADD NEW CATEGORY!): < Original research article >
• Title: < A stochastic Encoder Using Point Defects in Two-Dimensional Materials >
• Authors:
  • <Ravichandran, Harikrishnan (m, external)> -<Knobloch, Theresia (f, E360)> -<Radhakrishnan, Shiva Subbulakshmi (f, external)> -<Wilhelmer, Christoph (m, E360)> -<Stepanoff, Sergei P. (m, external)> -<Stampfer, Bernhard (m, E360)> -<Ghosh, Subir (m, external)> -<Oberoi, Aaryan (m, external)> -<Waldhoer, Dominic (m, E360)> -<Chen, Chen (m, external)> -<Redwing, Joan M. (f, external)> -<Wolfe, Douglas E. (m, external)> -<Grasser, Tibor (m, E360)> -<Das, Saptarshi (m, external)>
• Journal: < Nature Communications >
• Vol: <15>
• Issue/Number (optional): < >
• Article Number(optional): < 10562 >
• Start Page: < 1>
• End Page: <11 >
• Number of pages: < 11 >
• DOI: < doi.org/10.1038/s41467-024-54283-1 >
• Date of Issue: < 04/12/2024>
• Language: < English >
• Keywords: < Defects in electronics, Reliability of electronic devices, Two-dimensional (2D) semiconductors, Point defects, Field-effect transistors (FETs), Device modeling >
• Open access: yes, Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License, CC BY-NC-ND 4.0
• Research projects (TISS-Project-Acronyms ONLY: TISS->Research->My projects: pick from "Acronym" column (only project leaders can access this information)):
  • < European Research Council (ERC) under Grant agreement F2GO
• TU Wien Core facilities:
• Research areas -- Focal Areas and Fields: (pick from TU Wien Research Matrix's subcategories and assign a percentage share; in total it should add up to 100%.):
  • < e.g.: Modeling and Simulation (50%), Nanoelectronics (50%) >
• Invited: < no >
• File attachments:
  • Paper as PDF: ** s41467-024-54283-1.pdf**
  • Proof of invitation as PDF: INVITATION.PDF