Modeling Next Generation Sensor Chips: Towards Predictive Band Structure Models for Quarternary III-V Semiconductor Alloys

Talk or Poster (with paper)

• Category (PICK ONE FROM LIST; DO NOT CHANGE OR ADD NEW CATEGORY!): < Full-paper Contribution >
• Title: < Modeling Next Generation Sensor Chips: Towards Predictive Band Structure Models for Quarternary III-V Semiconductor Alloys >
• Authors:
  • < Gentles, Angus (m, external) >
  • < Dehghani, Mohammad (m, E360) >
  • < Minixhofer, Rainer (m, external) >
  • < Khakbaz, Pedram (m, E360) >
  • < Waldhor, Dominic (m, E360) >
  • < Waltl, Michael (m, E360) >
• Presenters:
  • < Gentles, Angus (m, external) >
• Conference: < International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) >
• Proceedings Title: < Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) >
• Proceedings Link: < https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10732909 >
• Conference City: < San Jose, CA >
• Conference Country: < USA >
• Conference Dates: < 25/09/2024 - 27/09/2024>
• Conference Format: < On-site >
• Conference Website: < https://www.sispad2024.org/ >
• Start Page: < 1 >
• End Page: < 4 >
• Number of pages: < 4 >
• ISBN: < 979-8-3315-1635-2 >
• DOI: < 10.1109/SISPAD62626.2024.10732909>
• Language: < English >
• Keywords: < Semiconductor device modeling, Density Functional Theory, DFT+U method, Sensor Chips, hybrid functionals >
• Open access: NO
• Research projects (TISS-Project-Acronyms ONLY: TISS->Research->My projects: pick from "Acronym" column (only project leaders can access this information)):
  • SiMatProp
• TU Wien Core facilities: < VSC >
• Research areas -- Focal Areas and Fields: (pick from TU Wien Research Matrix's subcategories and assign a percentage share; in total it should add up to 100%.):
  • < Modeling and Simulation (100%) >
• Invited: < no >
• Reviewed: < yes >
• File attachments:
  • Paper as PDF: ** Modeling_Next_Generation_Sensor_Chips_Towards_Predictive_Band_Structure_Models_for_Quarternary_III-_V_Semiconductor_Alloys.pdf**
  • Proof of invitation as PDF: INVITATION.PDF
  • Proof of review as PDF: REVIEW.PDF