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Multi-Scale Modeling of Transistors Based on the 2D Semiconductor Bi2O2Se

Talk or Poster (with paper)

  • Category (PICK ONE FROM LIST; DO NOT CHANGE OR ADD NEW CATEGORY!): < Full-paper Contribution >
  • Title: < Multi-Scale Modeling of Transistors Based on the 2D Semiconductor Bi2O2Se >
  • Authors:
    • < Davoudi, Mohammad Rasool (m, E360) >
    • < Khakbaz, Pedram (m, E360) >
    • < Knobloch, Theresia (m, E360) >
    • < Waldhoer, Dominic (m, E360) >
    • < Liu, Changze (m, external) >
    • < Nazir, Aftab (m, external) >
    • < Zhang, Yichi (m, external) >
    • < Peng, Hailin (m, external) >
    • < Grasser, Tibor (m, E360) >
  • Presenters:
    • < Davoudi, Mohammad Rasool (m, E360) >
  • Conference: < International Conference on Simulation of Semiconductor Processes and Devices >
  • Proceedings Title: < Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices >
  • Proceedings Link: < https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10319515 >
  • Conference City: < Kobe >
  • Conference Country: < Japan >
  • Conference Dates: < 27/09/2023 - End date 29/09/2023>
  • Conference Format: < On-site >
  • Conference Website: < https://sispad2023.jp/workshop/ >
  • Start Page: < 49 >
  • End Page: < 52 >
  • Number of pages: < 4 >
  • ISBN: < 979-8-3503-1368-0 >
  • DOI: < 10.23919/SISPAD57422.2023.10319609 >
  • Language: < English >
  • Keywords: < Bi2O2Se, Bi2SeO5, defects, 2D materials, reliability, TCAD, DFT, FET, MOSFET >
  • Open access: < no >
  • Research projects (TISS-Project-Acronyms ONLY: TISS->Research->My projects: pick from "Acronym" column (only project leaders can access this information)):
    • < e.g. WigEE >
    • < e.g. HPTCAD >
    • < e.g. EUMaster4HPC >
    • < e.g. EMQPhaseMod >
  • TU Wien Core facilities: < TCAD >
  • Research areas -- Focal Areas and Fields: (pick from TU Wien Research Matrix's subcategories and assign a percentage share; in total it should add up to 100%.):
    • < e.g.: Modeling and Simulation (50%), Nanoelectronics (50%) >
  • Invited: < no >
  • Reviewed: < yes >
  • File attachments: