Comphy v3.0—A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

Journal article

• Category (PICK ONE FROM LIST; DO NOT CHANGE OR ADD NEW CATEGORY!): Original research article
• Title: Comphy v3.0—A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices
• Authors:
  • < Waldhoer, Dominic (m, E360) >
  • < Schleich, Christian (m, E360) >
  • < Michl, Jakob (m, E360) >
  • < Grill, Alexander (m, external) >
  • < Claes , Dieter (m, external) >
  • < Karl, Alexander (m, E360) >
  • < Knobloch, Theresia (f, E360) >
  • < Rzepa, Gerhard (m, external) >
  • < Franco, Jacopo (m, external) >
  • < Kaczer, Ben (m, external) >
  • < Waltl, Michael (m, E360) >
  • < Grasser, Tibor (m, E360) >
• Journal: < Microelectronics Reliability >
• Vol: < 146 >
• Issue/Number (optional): < >
• Article Number(optional): < 115004 >
• Start Page: < 1 >
• End Page: < 15 >
• Number of pages: < 15 >
• DOI: < 10.1016/j.microrel.2023.115004 >
• Date of Issue: < 16/05/2023>
• Language: < English >
• Keywords: < Compact modeling, Charge trapping, Nonradiative multiphonon theory, Bias temperature instability, Random telegraph noise, Cryogenic modeling, Hysteresis, Trap-assisted-tunneling, Gate-leakage currents >
• Open access: < yes: CC BY 4.0 >
• Research projects (TISS-Project-Acronyms ONLY: TISS->Research->My projects: pick from "Acronym" column (only project leaders can access this information)):
  • < ERC >
• TU Wien Core facilities: < VSC >
• Research areas -- Focal Areas and Fields:
  • < Modeling and Simulation (100%) >
• Invited: < no >
• File attachments:
  • Paper as PDF: **1-s2.0-S002627142300104X-main.pdf **